HAYASHI , Marcelo; MARCON, Rogério; NUNES, Danilo Rocha. High resolution x-ray diffraction to characterize semiconductor materials . Physicae, [S. l.], v. 1, n. 1, p. 21–27, 2020. DOI: 10.5196/physicae.1.3. Disponível em: https://econtents.bc.unicamp.br/inpec/index.php/physicae/article/view/13476. Acesso em: 5 maio. 2024.